A New Approach to Programmable Memory Built-In Self Test Scheme
نویسندگان
چکیده
The design and architecture of a reconngurable memory BIST unit is presented. The proposed memory BIST unit could accommodate changes in the test algorithm with no impact to the hardware. Diierent types of march test algorithms could be realized using the proposed memory BIST unit and the proposed architecture allows addition and elimination of the memory BIST components. Therefore memories with diierent characteristics and test requirements could use the same memory BIST architecture. By integrating the diagnostics with this memory BIST unit, further reduction in the cost of test was achieved. Our experimental results show that the proposed memory BIST methodolgy leads to lower logic overhead than other programmable methods.
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